Jack M. Blakely

Professor, Materials Science and Engineering

312 Bard Hall, 607/255-5149, blakely@msc.cornell.edu

B.Sc 1958, Ph.D. 1961 (Glasgow)

Biography

Before coming to Cornell in 1963, Blakely spent two years as a research fellow in the Division of Engineering and Applied Physics at Harvard University. He has been a member of the technical staff at Sandia Laboratories; a Guggenheim fellow at the Cavendish Laboratory in Cambridge, England (1970-71); a visiting scientist at Argonne National Laboratory (1976-77); a National Science Foundation fellow at the University of California at Berkeley (1977); and an SERC fellow at York University, U.K. (1984). He has been a consultant to the Atomic Energy Commission, the Argonne National Laboratory, the Watervliet Arsenal Research Laboratories, the M&T Chemical Company, and the Lawrence Livermore National Laboratory. Blakely is a member of the Materials Research Society, the American Society for Metals, and the American Vacuum Society; he is a fellow of the American Physical Society and of the Institute of Physics, U.K.

 

Research Interests

The focus of the research in our group is the relationship between the properties of solid surfaces and their structure and composition. We are interested, in particular, in the following areas:
  • Surfaces and Interfaces: relationship between atomic structure and properties
  • Semiconductor Surfaces and Interfaces: energetics and kinetics of structural transitions involving atomic transport; atomic steps; nanofabrication and self organization
  • Sychrotron X-ray Methods: applications to surface structural problems, lattice strain at interfaces
  • Surfaces of Glasses: x-ray and tunneling microscopy studies of glass surface structure and kinetic processes
  • Adsorbed Phases and Oxidation Processes: effects of adsorbed monolayers on oxidation
  • Surfaces of Photographic Materials: fundamentals of image formation, writing with tunneling probes
    •

    Current Research Projects

    Microtopography of Semiconductor Surfaces and Interfaces (National Science Foundation)
    Sychrotron X-ray Methods (National Science Foundation)
    Surfaces of Glasses (National Science Foundation through the Cornell Center for Materials Research, CCMR)
    Adsorbed Phases and Oxidation Processes (Department of Energy)
    Surfaces of Photographic Materials

    Selected Publications

  • Blakely, J. M. 1973. Introduction to the properties of crystal surfaces. New York: Pergamon Press.
  • Blakely, J. M., ed. 1975. Surface physics of materials, 2 vol. New York: Academic Press.
  • "Surface Self Diffusion, Capillarity and Surface Steps", J.M. Blakely and C.C. Umbach, in Diffusion at Interfaces: Microscopic Concepts, ed. M Grunze, H.J.Kreuzer, and J.J.Weimer, Springer-Verlag, Berlin-Heidelberg, (1988).
  • "Structure of Submonolayer Gold on Si(111) from X-ray Standing Wave Triangulation", L.E. Berman, B.W. Batterman and J.M. Blakely, Phys. Rev. B, 38, (1988).
  • "X-ray Diffraction Study of the Ni(111)5o[110] Vicinal Surface", Phys. Rev. Lett.,65,451, (1990).
  • "Scanning Tunneling Microscope Studies of One-Dimensional Periodic Corrugated Si Surfaces", C.C. Umbach, M.E. Keeffe and J.M. Blakely,J. Amer Vac Soc.,A9,1014 (1991).
  • "LEED Studies of Atomic Step Transitions on a Ni(111) Vicinal Surface", J.P. Chang & J.M. Blakely, J. Vac. Sci. & Tech.10A,2154,(1992).
  • "Pairing of Curved Atomic Steps at the Extrema of periodic Gratings on Si(001)", C.C. Umbach, M.E.Keeffe and J.M. Blakely, J. Vac. Sci. Tech.,A11, 1830, (1993).
  • "X-ray Diffraction from a Coherently Illuminated Si(001) Grating Surface”, Q.Shen, C.C. Umbach, B.Weselak, and J.M. Blakely, Phys.RevB, 48, 17 967, (1993)
  • “Surface Self Diffusion on Si from the Evolution of Periodic Atomic Step Arrays”, M.E. Keeffe, C.C. Umbach, and J.M. Blakely, J Phys. Chem. Solids, 55,965, (1994).
  • “Fabrication of Arrays of Large Step-Free Regions on Si(001)”, So Tanaka, C.C. Umbach, J.M. Blakely, R.M. Tromp, M. Mankos, Appl. Phys. Lett., 69, 1235, (1996).
  • "Structure and Modification of Silver Halide Thin Films using Scanning Tunneling and Atomic Force Microscopy", Surface Science, 394, 221(1997).
  • "Step Permeability and the Relaxation of BiPeriodic Gratings on Si(001)" So Tanaka, N.C. Bartelt, C.C. Umbach, R.M. Tromp and J.M. Blakely, Phys. Rev. Lett., 78, 3342 (1997).
  • "Atomic Steps in the Decay of 1- and 2-Dimensional Gratings", Jack Blakely, C.C. Umbach and So Tanaka, in Dynamics of Crystal Surfaces and Interfaces,edited P.M. Duxbury and T.J. Pence. Plenum,(1997).
  • "Chemical Treatment of Glass Substrates," J.G. Couillard, D.G. Ast, C.C. Umbach, J.M. Blakely, C.B. Moore, F.P. Fehlner, Journal of Non-Crystalline Solids , 222 (1997) pp. 429-434
  • “Comparison of Step-Free Region Formation and Sublimation on Si(001) and Si(111)”, Doohan Lee and Jack Blakely, in Proceedings of STM’99, Seoul, Korea, (1999).
  • “Topography and Lattice Strain Development on Patterned Si Surfaces”, J.M. Blakely and C.C. Umbach, MICRON, 30, 3, (1999).
  • “Lattice Strain in Oxidized Si Nanostructure Arrays from X-ray Measurements”. S.Tanaka, C.C. Umbach, Q. Shen, and J.M. Blakely, Thin Film Solids, 343-344, 365, (1999).
  • “Atomic Step Dynamics on Periodic Semiconductor Surface Structures”., Jack M. Blakely, So Tanaka and Ruud Tromp, Japan J. Electron Microscopy, to be published, (1999).
  • "Formation and Stability of Large Step-free Areas on Si(001) and Si(111)”, Doohan Lee and Jack Blakely, submitted to Surface Science, (1999).
    •  Last revised: 8/4/97