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SEM skipping generations ahead (Nov 2017)

Compared with the Keck SEM, the new Gemini 500 can image down to 200V beam voltage and can achieve nanometer resolution at 20% of the beam voltage of its predecessor. Read More

New FTIR in the CCMR Bard Materials Facility

The CCMR Bard Materials Facility is continuing to support the Bruker Vertex V80V vacuum FTIR system, previously in the NBTC. Read More

The CCMR Shared facilities now offers a Keyence Laser Scanning Confocal Microscope! (April 2017)

The CCMR shared facilities is excited to announce the availability of a new Keyence VK-X260 Laser Microscope, combining a wide field of view, depth of focus, good spatial resolution, and little-to-no sample preparation. Read More

Combined epifluorescence and atomic force microscopy now available (Sept 2016)

A new epifluorescence imaging capability integrated with CCMR's atomic force microscope is available for general use. Read More

FEI and Cornell Collaborating on new EMPAD Detector

A new high dynamic range detector for FEI’s electron microscopes Read More

Welcome New CCMR Staff Member, Darren Dale (April 2016)

We are pleased to announce that Dr. Darren Dale has joined the CCMR Shared Facilities staff. Darren received his PhD in Materials Science & Engineering from Cornell in 2006... Read More

Texture analysis in the Mira SEM (April 2016)

A Bruker Electron Backscatter Diffracton (EBSD) system has been installed on the Mira SEM in Bard Hall. EBSD is primarily a technique for obtaining grain orientation information from highly polished samples. It can also reveal the microstructure and, Read More

Welcome New CCMR Staff Member, Mariena Silvestry-Ramos (Nov 2015)

The CCMR is pleased to announce that Dr. Mariena Silvestry Ramos joined our technical team in October 2015. Mariena majored in biology at the University of Puerto Rico... Read More

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