Facilities
The Shared Facilities of the Cornell Center for Materials Research offers world-class materials analysis and processing equipment overseen by expert facility managers. Our staff provides expert consultation and advice while also training the next generation of materials researchers from Cornell and beyond. The CCMR Shared Facilities operates a wide range of instruments for:
- Electron & optical microscopy
- Spectroscopy & electronic measurements
- Surface analysis & characterization
- Soft matter/polymer analysis
- X-ray & diffraction analysis
- Thin film deposition & materials processing
- Mechanical properties, testing & analysis
Detailed information about the equipment capabilities and training requirements, including location and contact information is provided through the navigation tree on the left or can be found easily using the Search field on this page. Prospective users are encouraged to contact any of our facility managers who will be happy to help you select the appropriate resources and methods for your project. Initial consultations are free, so a discussion with one of the CCMR facility managers can help you get started quickly. All users of the Shared Facilities, both internal and external, are charged on a fee-for-use basis in accordance with Cornell and national regulations as detailed in the Policies and Procedures
Facilities Sections
User Instruments
- Electron and Optical Microscopy
- Transmission Electron Microscopy
- Scanning Electron Microscopy
- Scanning Probe Microscopy
- Focused Ion Beam
- Optical Microscopy
- Sample Preparation for Electron Microscopy
- Spectroscopy and Electronic Measurements
- Electronic & Magnetic Measurements
- Optical Spectroscopy
- Electron Spectroscopy
- X-ray Photoelectron Spectroscopy
- EELS Microscopy
- Mass Spectroscopy
- Dielectric Spectroscopy
- Surface Analysis and Characterization
- X-ray photoelectron spectroscopy
- Asylum-MFP3D-Bio-AFM-SPM
- Veeco Dimension 3100 Ambient AFM STM
- JEOL JSPM 4500 UHV STM
- Nanonics Multiview 1000 or 2000 Near-field Scanning Optical Microscopy (NSOM)
- Renishaw InVia Confocal Raman microscope
- ADE Phase Shift MicroXAM Optical Interferometric Profiler
- Contact Profilometry
- Soft Matter/Polymer Analysis
- Size Exclusion Chromatography
- Thermal Analysis
- Waters MALDI Micro MX (MALDI-TOF)
- X-ray and Diffraction Analysis
- Mechanical Properties Testing and Analysis
- Dynamic Testing
- Hardness Testing
- Micro Mechanical testing
- Thermal Analysis
- Size Classification
- Thin Film Deposition and Material Processing
- Thin films and coatings
- Wet chemical
- Heat Treating
- Shaping/Pressing
- Molding
- Cold pressing
- Glove Boxes
- Sample Preparation, Cutting, Polishing, Shaping, Joining, and Machining
- Sub-micron-scale Cutting
- Macroscopic Cutting and Drilling
- Jet machining
- Wafer saws
- Wire saws
- Abrasive Saws
- Diamond Saws
- Polishing/Grinding
- Mixing/Milling
- Sample Mounting
- Sample Cleaning
- Machining
- Wire Pulling
- Welding/ Brazing/ Bonding
- Spot welding
- Wire Bonding
- Test Equipment Lending Library
- General Test and Measurement Equipment
- Leak detectors
- Portable Vacuum and Pump Systems
- Optical Pyrometers
- Balances
- Rough Pumps
- Poster Help and Printing
Search Equipment
Other Facilities
Facilities Contact

Jurriaan Gerretsen
- Director of Shared Facilities
- t. 607.279.6955


