Lena Fitting

TEM: FEI(Tecnai)-Duffield

Plan view annular dark field scanning transmission electron microscopy image of a 1nm thin SrTiO3 grown on Si(100) and capped with 15nm a-Si, reveals a non-uniform coverage and the formation of SrTiO3 islands. Imaging of such thin films at atomic resolution (inset) was archived by using the Si substrate as a “focusing lens” by means of electron channeling.

AEP
Advisor          David A. Muller