Cornell Center for Materials Research

Microscopy Contest Images

Facilities Sections

User Instruments

Electron and Optical Microscopy
- Transmission Electron Microscopy
- Scanning Electron Microscopy
- Scanning Probe Microscopy
  - Veeco Dimension 3100 Ambient AFM STM
  - JEOL JSPM 4500 UHV STM
- Focused Ion Beam
  - FEI Strata 400 STEM FIB
- Optical Microscopy
- Sample Preparation for Electron Microscopy
Spectroscopy and Electronic Measurements
- Optical Spectroscopy
- Electron Spectroscopy
  - X-ray Photoelectron Spectroscopy
  - EELS Microscopy
    - FEI Tecnai G2 F20 TEM STEM
    - NION UltraSTEM 100
- Mass Spectroscopy
  - Waters MALDI Micro MX (MALDI-TOF)
- Dielectric Spectroscopy
  - Novocontrol Turnkey Concept N40 Broadband
  - Novocontrol Thermal Stimulated Depolarization Current (TSDC)
- CNS Electronics Measurements
  - SQUID Magnetometer
  - Cryogenic Probe Stations
- Chemistry NMR Spectroscopy
Surface Analysis and Characterization
- X-ray Photoelectron Spectroscopy
  - X-ray photoelectron spectroscopy
- Scanning Probe Microscopy
  - Veeco Dimension 3100 Ambient AFM STM
  - JEOL JSPM 4500 UHV STM
- Near field Scanning Optical Microscopy
- Confocal Raman Microscopy
- ADE Phase Shift MicroXAM Optical Interferometric Profiler
- Contact Profilometry
  - Tencor Alpha step 200
  - Tencor Alpha step 500
Soft Matter/Polymer Analysis
- Size Exclusion Chromatography
  - Waters Ambient-Temperature GPC
  - High Temperature GPC
- Thermal Analysis
- MALDI-TOF Mass Spectrometry
X-ray and Diffraction Analysis
Mechanical Properties Testing and Analysis
- Particle Size Analysis
  - BIC 200 SM Static and Dynamic Light Scattering (SLS and DLS)
  - Coulter N4 SD Photon Correlation Spectroscopy (PCS)
- Static Testing
  - Instron 4400 20 kip Load Frame
- Dynamic Testing
  - MTS 10 kip Load Frame
  - Dynamic Mechanical Analysis
- Hardness Testing
  - Micro Hardness Tester
  - Rockwell Hardness Tester
- Thermal Analysis
  - TA Instruments Q400EM Thermomechanical Analysis (TMA)
  - TA Instruments DMA Q800 Dynamic Mechanical Thermal Analysis (DMTA)
- Size Classification
  - ATM Sonic sifter
Thin Film Deposition and Material Processing
- Thin films and coatings
  - Evaporation
  - Sputterin Deposition System
  - Wet chemical
    - Brewer Science CEE 100B Spin coater
    - Electroplating (gold)
- Heat Treating
  - Air Furnaces
  - Controlled Atmosphere Furnaces
  - High Vacuum Furnaces
  - Vacuum Ovens
    - Vacuum Ovens
- ThermoElectron Twin Screw Extruder
- Shaping/Pressing
  - Extruding
    - Compounder
  - Molding
    - Grimco Compression Molding press
  - Hot pressing
    - H.D. Brew
    - Controlled Atmosphere Hot Press
  - Cold pressing
- Glove Boxes
  - Inert Gas Glove Box
- Spray Drying
  - Buchi-190 Spray dryer
Sample Preparation, Cutting, Polishing, Shaping, Joining, and Machining
- Sub-micron-scale Cutting
  - FIB
  - Cryoultramicrotome
- Macroscopic Cutting and Drilling
  - Jet machining
    - OMAX 2626 Abrasive Water Jet cutter
    - SS White Sand Blasting Unit
  - Wafer saws
    - MicroMech Wafering Machine
    - Aremco Wafer cutting Diamond Saw
  - Wire saws
    - WELL Diamond wire Saw
    - South Bay wire saw
  - Slurry cutting
    - Sonic Mills Sonic Impact Grinder
    - South Bay slurry drill
  - Spark cutting
    - Elox EDM
  - Abrasive saws
    - Cutoff Saw 8�
    - Cutoff Saw 12�
  - Diamond saws
- Polishing/Grinding
  - Allied Multiprep polishing systems
  - Electropolishing
    - Electropolishing (copper)
    - Electropolishing (stainless steel)
  - Abrasive Grinding/Polishing
- Mixing/Milling
- Sample Mounting
  - Buehler Simplemet II mounting press
  - Cold Mounting Epoxies
- Sample Cleaning
  - Plasma Cleaning
    - Plasma-Preen Etcher/Cleaner
  - Ultrasonic Cleaning
    - Branson Ultrasonic Bath (large and small units)
  - Abrasive Cleaning
    - Glass Bead Abrasive Units (sand blasting)
- Machining
  - Mills
    - Bridgeport Vertical
    - Hardinge Horizontal
  - Lathes
    - Hardinge Tool Room Lathe
    - Cincinnati Tray top
  - Drill Presses
    - Core Drill
  - Band Saws
    - Band Saw Vertical
    - Band Saw Horizontal
  - Spark Cutters
    - Elox EDM
  - Surface Grinders
    - SUPRA-618 Surface Grinder
- Wire Pulling
  - Meteor Coil Winder
- Welding/ brazing/ bonding
  - Spot welding
    - Unitek Portable
    - Stationary Spot Welder (Hughes HRW250B)
  - Inert Gas welding
    - Miller Intellitig 40
  - Vaccum Brazing
    - RC Chambers Vacuum Brazing Furnace
  - Soldering
    - Soldering Torches and Irons
  - Wire Bonding
    - MEI 1204 manual bonder
    - Kulicke and Soffa 4500 manual bonder
General Test and Measurement Equipment
- Leak detectors
  - Portable Helium
    - Varian 979 Port Leak Detector
    - Varian 959-50 Leak Detector
- Optical Pyrometers
  - Optical Pyrometers Portable
  - Santa Barbara Focal Plane IR Camera
- Balances
  - Mettler Balances
Computing and Printing
- CCMR Computing
- Poster Printing

Pubs & Docs

Other Facilities

Facilities Contact

Jurriaan Gerretsen

Jurriaan Gerretsen
Director of Shared Experimental Facilities
t. 607.255.4274

Email Facilities