Cornell Center for Materials Research

Miro Image Contest Winners

Microscopy Image Contest Winners and Entries

The Microscopy Facilities at the Cornell Center for Materials Research hosted a tri-annual competition for the best image produced using an electron microscope.

First Place Winners
Judy Cha Tecnai	Jeremy Steinbacher Bard Hall SEM	Jose M. Moran-Mirabal Keck SEM
Second Place Winners
Peter Ercius Tecnai	Scott Warren LEO 922	Gil Toombes Keck SEM

All Other Entries
Chandrani Roychowdhury UHV-STEM	Huajun Zhou Bard SEM	Jeremy Steinbacher Keck SEM
Marleen Kamperman Keck SEM	Robert Weissgraeber Keck SEM	Sara Maccagnano UHV-STEM
Ferdinand Kuemmeth Keck SEM	Marleen Kamperman LEO922

Facilities Sections

User Instruments

Electron and Optical Microscopy
- Transmission Electron Microscopy
- Scanning Electron Microscopy
- Scanning Probe Microscopy
  - Veeco Dimension 3100 Ambient AFM STM
  - JEOL JSPM 4500 UHV STM
- Focused Ion Beam
  - FEI Strata 400 STEM FIB
- Optical Microscopy
- Sample Preparation for Electron Microscopy
Spectroscopy and Electronic Measurements
- Optical Spectroscopy
- Electron Spectroscopy
  - X-ray Photoelectron Spectroscopy
  - EELS Microscopy
    - FEI Tecnai G2 F20 TEM STEM
    - NION UltraSTEM 100
- Mass Spectroscopy
  - Waters MALDI Micro MX (MALDI-TOF)
- Dielectric Spectroscopy
  - Novocontrol Turnkey Concept N40 Broadband
  - Novocontrol Thermal Stimulated Depolarization Current (TSDC)
- CNS Electronics Measurements
  - SQUID Magnetometer
  - Cryogenic Probe Stations
- Chemistry NMR Spectroscopy
Surface Analysis and Characterization
- X-ray Photoelectron Spectroscopy
  - X-ray photoelectron spectroscopy
- Scanning Probe Microscopy
  - Veeco Dimension 3100 Ambient AFM STM
  - JEOL JSPM 4500 UHV STM
- Near field Scanning Optical Microscopy
- Confocal Raman Microscopy
- ADE Phase Shift MicroXAM Optical Interferometric Profiler
- Contact Profilometry
  - Tencor Alpha step 200
  - Tencor Alpha step 500
Soft Matter/Polymer Analysis
- Size Exclusion Chromatography
  - Waters Ambient-Temperature GPC
  - High Temperature GPC
- Thermal Analysis
- MALDI-TOF Mass Spectrometry
X-ray and Diffraction Analysis
Mechanical Properties Testing and Analysis
- Particle Size Analysis
  - BIC 200 SM Static and Dynamic Light Scattering (SLS and DLS)
  - Coulter N4 SD Photon Correlation Spectroscopy (PCS)
- Static Testing
  - Instron 4400 20 kip Load Frame
- Dynamic Testing
  - MTS 10 kip Load Frame
  - Dynamic Mechanical Analysis
- Hardness Testing
  - Micro Hardness Tester
  - Rockwell Hardness Tester
- Thermal Analysis
  - TA Instruments Q400EM Thermomechanical Analysis (TMA)
  - TA Instruments DMA Q800 Dynamic Mechanical Thermal Analysis (DMTA)
- Size Classification
  - ATM Sonic sifter
Thin Film Deposition and Material Processing
- Thin films and coatings
  - Evaporation
  - Sputterin Deposition System
  - Wet chemical
    - Brewer Science CEE 100B Spin coater
    - Electroplating (gold)
- Heat Treating
  - Air Furnaces
  - Controlled Atmosphere Furnaces
  - High Vacuum Furnaces
  - Vacuum Ovens
    - Vacuum Ovens
- ThermoElectron Twin Screw Extruder
- Shaping/Pressing
  - Extruding
    - Compounder
  - Molding
    - Grimco Compression Molding press
  - Hot pressing
    - H.D. Brew
    - Controlled Atmosphere Hot Press
  - Cold pressing
- Glove Boxes
  - Inert Gas Glove Box
- Spray Drying
  - Buchi-190 Spray dryer
Sample Preparation, Cutting, Polishing, Shaping, Joining, and Machining
- Sub-micron-scale Cutting
  - FIB
  - Cryoultramicrotome
- Macroscopic Cutting and Drilling
  - Jet machining
    - OMAX 2626 Abrasive Water Jet cutter
    - SS White Sand Blasting Unit
  - Wafer saws
    - MicroMech Wafering Machine
    - Aremco Wafer cutting Diamond Saw
  - Wire saws
    - WELL Diamond wire Saw
    - South Bay wire saw
  - Slurry cutting
    - Sonic Mills Sonic Impact Grinder
    - South Bay slurry drill
  - Spark cutting
    - Elox EDM
  - Abrasive saws
    - Cutoff Saw 8�
    - Cutoff Saw 12�
  - Diamond saws
- Polishing/Grinding
  - Allied Multiprep polishing systems
  - Electropolishing
    - Electropolishing (copper)
    - Electropolishing (stainless steel)
  - Abrasive Grinding/Polishing
- Mixing/Milling
- Sample Mounting
  - Buehler Simplemet II mounting press
  - Cold Mounting Epoxies
- Sample Cleaning
  - Plasma Cleaning
    - Plasma-Preen Etcher/Cleaner
  - Ultrasonic Cleaning
    - Branson Ultrasonic Bath (large and small units)
  - Abrasive Cleaning
    - Glass Bead Abrasive Units (sand blasting)
- Machining
  - Mills
    - Bridgeport Vertical
    - Hardinge Horizontal
  - Lathes
    - Hardinge Tool Room Lathe
    - Cincinnati Tray top
  - Drill Presses
    - Core Drill
  - Band Saws
    - Band Saw Vertical
    - Band Saw Horizontal
  - Spark Cutters
    - Elox EDM
  - Surface Grinders
    - SUPRA-618 Surface Grinder
- Wire Pulling
  - Meteor Coil Winder
- Welding/ brazing/ bonding
  - Spot welding
    - Unitek Portable
    - Stationary Spot Welder (Hughes HRW250B)
  - Inert Gas welding
    - Miller Intellitig 40
  - Vaccum Brazing
    - RC Chambers Vacuum Brazing Furnace
  - Soldering
    - Soldering Torches and Irons
  - Wire Bonding
    - MEI 1204 manual bonder
    - Kulicke and Soffa 4500 manual bonder
General Test and Measurement Equipment
- Leak detectors
  - Portable Helium
    - Varian 979 Port Leak Detector
    - Varian 959-50 Leak Detector
- Optical Pyrometers
  - Optical Pyrometers Portable
  - Santa Barbara Focal Plane IR Camera
- Balances
  - Mettler Balances
Computing and Printing
- CCMR Computing
- Poster Printing

Pubs & Docs

Other Facilities

Facilities Contact

Jurriaan Gerretsen

Jurriaan Gerretsen
Director of Shared Experimental Facilities
t. 607.255.4274

Email Facilities

Edited on: 06 January 2009 11:40 am

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© 2009 CCMR. Materials from the CCMR website may not be used without permisson. Support for the CCMR is provided through the NSF Grant DMR 0520404, part of the NSF MRSEC Program. Additional support is provided by Cornell University, the State of New York, and by industrial sources.

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