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UHV-STEM and Keck SEM

Lena Fitting | lf56@cornell.edu

UHV-STEM (VG)
Annular dark field (ADF) image of a LaVO3 (bright)/SrTiO3 superlattice grown by pulsed laser deposition. The view is down the [100] zone axis of the SrTiO3 substrate. Right, a magnified view of a single, double and triple LaVO3 layer in SrTiO3. The raw image has been filtered to reduce noise.

Applied and Engineering Physics

David A. Muller | dm24@cornell.edu