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Tecnai and 1200

Lena Fitting | lf56@cornell.edu

Tecnai (FEI)
(a) High-angle annular dark field (HAADF) image of screw dislocations at the low-angle (∼2°) twist grain boundary between SrTiO3 and Nb:SrTiO3. (b) In low-angle annular dark field (LAADF) imaging the strain field at the grain boundary can be detected. (c) LAADF image of uniformly spaced dislocation cores at the grain boundary.

Applied and Engineering Physics

David A. Muller | dm24@cornell.edu