Cornell Center for Materials Research

JEOL JSPM 4500 UHV STM

Bard SB-47 (subbasement)

 

Christopher (Kit) Umbach
Office (607) 255-7339
Cell (607) 592-5212
umbach@ccmr.cornell.edu
126 Bard Hall

Specifications
Atomic force microscopy in vacuum up to sample temperatures of 400°C: contact, tapping, noncontact, lateral force, for topographic imaging at high spatial resolution(<5 nm).
Scanning tunneling microscopy (STM) in vacuum up to sample temperatures of 500°C and tunnel currents below 1 picoampere: atomic-scale topography and spatially resolved electron spectroscopy of conducting materials.
Special applications: a) electron beam irradiation or laser beam irradiation (He:Cd 325 nm) of the sample while on the AFM/STM stage; b) a UHV processing chamber for deposition of thin-films, sputter cleaning, and high- temperature heating (up to 1200°C) prior to imaging.
Equipment
JEOL JSPM 4500 ultrahigh vacuum scanning probe microscope.

 
Edited on: 26 May 2009 5:38 pm