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User Instruments

  • Electron and Optical Microscopy
    • Transmission Electron Microscopy
      • FEI F20 TEM STEM
      • FEI T12 Spirit TEM STEM
      • NION UltraSTEM 100
      • FEI T12 TWIN TEM
    • Scanning Electron Microscopy
      • LEO 1550 FESEM (Keck SEM)
      • LEICA 440 SEM
      • JEOL 8900 Microprobe
      • Hitachi 4500 SEM
    • Scanning Probe Microscopy
      • Asylum-MFP3D-Bio-AFM-SPM
      • Veeco Dimension 3100 Ambient AFM STM
      • JEOL JSPM 4500 UHV STM
    • Focused Ion Beam
      • FEI Strata 400 STEM FIB
    • Optical Microscopy
      • Leitz Laborlux 12 hl Optical Microscope
      • Olympus BX51 W1F
      • Leitz Laborlux 12 POL S
      • Olympus BX51 with crossed polarization
      • Olympus BH-2 with darkfield
    • Sample Preparation for Electron Microscopy
      • Fischione 1010 Ion mill
      • FEI Strata 400 STEM FIB
      • Allied Multiprep polisher-A
      • Allied Multiprep polisher-B
      • Sputter coater for SEM-Bard
      • Sputter coater for SEM-Clark
      • Sputter coater for SEM-Duffield
      • Leica EM UC7/FC7 Cryoultramicrotome
      • Leica Ultracut UCT Ultramicrotome
  • Spectroscopy and Electronic Measurements
    • Electronic & Magnetic Measurements
      • PPMS
      • SQUID
      • Lakeshore Cryogenic Probe Stations
      • Cascade Four-Point Probe
      • FW Bell Gaussmeters
    • Optical Spectroscopy
      • Mattson 5020 FTIR Spectrometer
      • Bruker Hyperion FT-IR Spectrometer & Microscope
      • Shimadzu UV-Vis-NIR Spectrometer
      • Aviv 400 Circular Dichroism Spectrometer
      • Renishaw InVia Confocal Raman microscope
    • Electron Spectroscopy
      • X-ray Photoelectron Spectroscopy
      • EELS Microscopy
        • FEI F20 TEM STEM
        • NION UltraSTEM 100
    • Mass Spectroscopy
      • Waters MALDI Micro MX (MALDI-TOF)
    • Dielectric Spectroscopy
      • Novocontrol Broadband Dielectric Spectrometer
      • Novocontrol Thermal Stimulated Depolarization Current (TSDC)
  • Surface Analysis and Characterization
    • X-ray photoelectron spectroscopy
    • Asylum-MFP3D-Bio-AFM-SPM
    • Veeco Dimension 3100 Ambient AFM STM
    • JEOL JSPM 4500 UHV STM
    • Nanonics Multiview 1000 or 2000 Near-field Scanning Optical Microscopy (NSOM)
    • Renishaw InVia Confocal Raman microscope
    • ADE Phase Shift MicroXAM Optical Interferometric Profiler
    • Contact Profilometry
      • Tencor Alpha step 500
  • Soft Matter/Polymer Analysis
    • Size Exclusion Chromatography
      • Waters Ambient-Temperature GPC
      • Waters Ambient-Temperature-Aqueous GPC
      • High Temperature GPC
    • Thermal Analysis
      • TA Instruments Q500 Thermogravimetric Analyzer (TGA)
      • TA Instruments Q1000 Modulated Differential Scanning Calorimeter (MDSC)
      • TA Instruments Q400EM Thermomechanical Analysis (TMA)
      • TA Instruments DMA Q800 Dynamic Mechanical Thermal Analysis (DMTA)
    • Waters MALDI Micro MX (MALDI-TOF)
  • X-ray and Diffraction Analysis
    • Scintag Theta-Theta X-ray Diffractometer (XRD)
    • Bruker General Area Detector Diffraction System (GADDS)
    • Multiwire Back-Reflection Laue Detector
    • Rigaku SmartLab X-Ray Diffractometer
  • Mechanical Properties Testing and Analysis
    • Dynamic Testing
      • TA Instruments DMA Q800 Dynamic Mechanical Thermal Analysis (DMTA)
    • Hardness Testing
      • Micro Hardness Tester
    • Micro Mechanical testing
      • Micro Mechanical Analyzer
    • Thermal Analysis
      • TA Instruments Q400EM Thermomechanical Analysis (TMA)
      • TA Instruments DMA Q800 Dynamic Mechanical Thermal Analysis (DMTA)
    • Size Classification
      • ATM Sonic sifter
  • Thin Film Deposition and Material Processing
    • Thin films and coatings
      • Neocera Ex200 Pulsed Laser Deposition System
      • Varian Thermal Bell Jar Evaporator
      • Sputtering Deposition System
      • KJL Magnetron Sputtering Tool
    • Wet chemical
      • Laurell-WS-400A-Spin-Coater
    • Heat Treating
      • Air Furnaces
      • Controlled Atmosphere Furnaces
      • High Vacuum Furnaces
      • Vacuum Ovens
        • Hotpack Vacuum Oven
    • Shaping/Pressing
      • Molding
        • Grimco Compression Molding press
      • Cold pressing
        • Carver 25 ton press
        • Parr Pressure Reactor
    • Glove Boxes
      • Inert Gas Glove Box
  • Sample Preparation, Cutting, Polishing, Shaping, Joining, and Machining
    • Sub-micron-scale Cutting
      • FEI Strata 400 STEM FIB
      • Leica EM UC7/FC7 Cyroultramicrotome
      • Leica Ultracut UCT Ultramicrotome
    • Macroscopic Cutting and Drilling
      • Jet machining
        • SS White Sand Blasting Unit
      • Wafer saws
        • MicroMech Wafering Machine
        • Aremco Wafer cutting Diamond Saw
      • Wire saws
        • WELL Diamond wire Saw
      • Abrasive Saws
        • Cutoff Saw 8 Inch
        • Cutoff Saw 12 Inch
      • Diamond Saws
        • Buehler Isomet Low Speed Diamond Saw
        • Wale Diamond Band Saw
        • Conrad Universal Cutting Machine
    • Polishing/Grinding
      • Allied Multiprep polisher-A
      • Allied Multiprep polisher-B
      • Abrasive Grinding/Polishing
        • Glass Bead Abrasive Units (sand blasting)-Bard
        • Glass Bead Abrasive Units (sand blasting)-Clark
        • Struers Rotopol
        • Buehler Grinding/Polishing 12 inch
        • Buehler SiC Grinding Papers Bard
    • Mixing/Milling
      • Ball Mill
      • Spex 8000 MIXER /MILL
      • Garlock GEM-T Jet mill
    • Sample Mounting
      • Buehler Simplemet II mounting press
      • Cold Mounting Epoxies
    • Sample Cleaning
      • Plasma-Preen Etcher/Cleaner
      • Branson Ultrasonic Bath (large)
      • Branson Ultrasonic Bath (small)
      • Glass Bead Abrasive Units (sand blasting)-Bard
      • Glass Bead Abrasive Units (sand blasting)-Clark
      • SS White Sand Blasting Unit
    • Machining
      • Wire Pulling
        • Meteor Coil Winder
      • Welding/ Brazing/ Bonding
        • Spot welding
          • Unitek Portable
          • Stationary Spot Welder (Hughes HRW250B)
        • Wire Bonding
          • MEI 1204 manual bonder
          • Kulicke and Soffa 4500 manual bonder
  • Test Equipment Lending Library
    • Lending Library
  • General Test and Measurement Equipment
    • Leak detectors
      • Varian 979 Port Leak Detector
      • Extorr XT200 Residual Gas Analyzer
    • Portable Vacuum and Pump Systems
      • Portable-Turbo-Pump-1-Clark
      • Portable-Turbo-Pump-2-Clark
      • Portable-Turbo-Pump-Bard
    • Optical Pyrometers
      • Optical-Pyrometers-Portable
    • Balances
      • Ohaus-Balance
      • Mettler Balances
    • Rough Pumps
      • Rough-Pump-1-Clark
      • Rough-Pump-2-Clark
      • Rough-Pump-3-Clark
      • Rough-Pump-4-Clark
      • Rough-Pump-5-Clark
  • Poster Help and Printing
    • Poster Help
    • Poster Printing at Mann Library

Search Equipment

Other Facilities

  • Other MRSEC Facilities

  • The Cornell High Energy Synchrotron Source (CHESS)

  • The Cornell Theory Center

  • Cornell NanoScale Science & Technology Facility (CNF)

  • The Nanobiotechnology Center (NBTC)

Facilities Contact

Jurriaan Gerretsen
  • Jurriaan Gerretsen

  • Director of Shared Facilities
  • t. 607.279.6955

Email Facilities

 
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© 2013 CCMR. Materials from the CCMR website may not be used without permisson. Support for the CCMR is provided through the NSF Grant DMR-1120296, part of the NSF MRSEC Program. Additional support is provided by Cornell University, the State of New York, and by industrial sources.
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