Cornell Center for Materials Research

VG UHV STEM

Clark Hall E1

Reservations

 

 

Mick (Malcolm) Thomas
Office (607) 255-0650
Cell (607) 592-8993
mt57@cornell.edu
212 Clark Hall

STEM

Provides quantitative imaging and spectroscopic analysis of materials at very high spatial and energy resolution. Typical experiments include studies of interfaces and grain boundaries of semiconductors, III-V compounds, ceramics, superconductors, and metal alloys. Beam-sensitive materials can be quantitatively analyzed due to the high efficiency of the detectors.
Electron Energy Loss Spectroscopy (EELS)
EELS offers elemental identification and studies of nearest-neighbor bonding at the atomic scale.
X-ray (EDX)
A windowless Si(Li) detector provides elemental analysis of the specimen from spatial sizes as small as 1nm.
High Resolution Imaging
Researchers have acheived point-to-point resolutions of ~0.2 nm, as well as a lattice fringe resolution of 0.2 nm. Energy filtered images may also be obtained.
Diffraction
Convergent beam electron diffraction (CBED), energy filtered CBED, and selected area diffraction (SAD) modes are available in the Clark Hall facility.

 
Edited on: 26 May 2009 5:38 pm