Cornell Center for Materials Research

Renishaw InVia Confocal Raman microscope

SB-30 Bard Hall

Reservations

 

Christopher (Kit) Umbach
Office (607) 255-7339
Cell (607) 592-5212
umbach@ccmr.cornell.edu
126 Bard Hall

Raman

Specifications
Reflection Raman microscopy enables chemical identification of elements and compounds with a spatial resolution of ~1 µm. Raman shifts within 150 cm-¹ of the excitation frequency can be measured at excitation wavelengths of either 488 nm or 785 nm with a spectral resolution of ~0.1 cm-¹.
Spatial maps of Raman intensity over an area 70 µm x 70 µm can be made using a Nanonics scan stage.
Specialized applications: a) polarized Raman; b) photoluminescence; c) simultaneous Raman/AFM.
Equipment
Renishaw InVia microRaman system. Objectives: 5x, 10x, 20x, 50x (N.A. 0.75 for Raman imaging), 50x (N.A. 0.45 for Raman imaging, long-working distance).

http://www.renishaw.com
 
Edited on: 26 May 2009 5:38 pm