Cornell Center for Materials Research

Tencor Alpha step 200

Bard B56

 

John Sinnott
Office (607) 255-3371
Cell (607) 592-8996
jps39@cornell.edu
B-57 Bard Hall

Alpha Step 200
Tencor
Alpha Step 200

Stylus-based profiler for measuring the thickness of deposited thin films, surface topography, and other specialty measurements.

http://www.brumleysouth.com/as500.php

 
Edited on: 26 May 2009 5:38 pm