Cornell Center for Materials Research

NION UltraSTEM 100

Duffield Hall 150

 

Mick (Malcolm) Thomas
Office (607) 255-0650
Cell (607) 592-8993
mt57@cornell.edu
212 Clark Hall

UltraSTEM
cs-corrected scanning transmission electron microscope

The SuperSTEM has a spherical aberration corrector integrated into its column, which nulls all axial aberrations up to fifth order. As a result, an angstrom-scale probe with 0.1 nA of current will enable imaging with angstrom-level (0.1 nm) resolution. The electron optics can be quickly changed to produce a 2-3 angstrom probe with 1 nA or more of current for analytical purposes (electron energy loss spectroscopy). Samples can be automatically oriented to a given axis.

 
Edited on: 26 May 2009 5:38 pm