Cornell Center for Materials Research

Scintag Theta-Theta X-ray Diffractometer (XRD)

1158 Snee

Reservations

 

Maura Weathers
Office (607) 255-2295
Cell (607) 592-2091
msw11@cornell.edu
1158 Snee Hall Earth & Atmospheric Sciences



PAD-X

This X-ray diffractometer is used to analyze powders, bulk samples, polymers, and polycrystalline thin films. The instrument is used extensively for phase identification, which is done by comparing diffraction scans with the JCPDS database of ~250,000 patterns. Additional information that can be obtained through X-ray diffraction includes crystallite size, % crystallinity, quantification of phases in a sample, and lattice parameter determinations. Analysis of the diffraction data can be done using MDI JADE, an industry standard for XRD analyses.
 
Edited on: 26 May 2009 5:38 pm