Cornell Center for Materials Research

LEO 1550 FESEM (Keck SEM)

Clark Hall F3

Reservations

 

 

Mick (Malcolm) Thomas
Office (607) 255-0650
Cell (607) 592-8993
mt57@cornell.edu
212 Clark Hall

Keck SEM

Imaging at very high resolution (1 nm at 20 KeV and 2.5 nm at 5 KeV) is possible with certain types of specimens. Its superb performance, particularly at low accelerating voltages (i.e. 0.5 to 3 KV), makes it especially suitable for imaging the surface detail of polymeric, biological, and other low-density materials. Secondary Electron Imaging An in-lens secondary electron detector enables a very short working distance and responds to the lowest voltage secondary electrons. Transmission Electron Imaging TEM grids may be used in a special stage in conjunction with a detector below the specimen to obtain transmitted electron images.

 
Edited on: 26 May 2009 5:38 pm