LEICA 440 SEM | ||
|
Bard Hall SB56 |
John Hunt | |
|---|---|---|
|
SEM |
||
|
Scanning electron microscopes (SEM) scan a sample using a focused probe of electrons in a raster pattern. The interaction of the probe with the sample produces signals containing information about the sample’s surface, composition, and in some cases, crystallography. Training is available. This SEM has a secondary electron detector for surface imaging, and a backscattered electron detector for composition-based imaging. Resolution is 6 nm at 30 KeV. Special Feature: Electron Backscatter Diffraction (EBSD) Pristine or very carefully polished (i.e. using colloidal silica) surfaces with a minimum grain size of about one micron can be characterized according to each grain’s crystallographic orientation. This is accomplished using an HKL Nordlys detector and associated software for automated acquisition and orientation analysis. Eucentric Tilting Specimen Stage: Tilting is eucentric at any working distance. This facilitates observation while tilting as high as 90 degrees, and is ideal for recording stereo pairs for 3-D viewing. | ||
|
The electron gun uses a W filament. The vacuum system uses a turbopump backed by a standard mechanical pump. Images are recorded digitally. | ||
Search Equipment
Facilities Contact
Jurriaan Gerretsen
- Director of Shared Experimental Facilities
- t. 607.255.4274
