Cornell Center for Materials Research

JEOL 8900 Microprobe

Snee Hall 1149

Reservations

 

John Hunt
Office (607) 255-3789
Cell (607) 592-8990
hunt@ccmr.cornell.edu
SB56 Bard Hall

The Probe
JEOL
8900

This is used for quantitative elemental analysis of samples on a micron scale. Samples should be flat and are frequently polished to one micron grit or better. Holders are available for round mounts measuring one inch, one inch and a quarter, or one inch and a half. A special holder for unusually shaped specimens is also available. Nonconducting specimens are normally coated with carbon using the Edwards evaporator located in SB56 Bard Hall.

There are 5 wavelength dispersive X-ray spectrometers (WDS), an energy dispersive X-ray detector (EDS). The scanning system forms images from secondary and backscattered electrons, and maps from X-rays.

http://www.jeol.com
 
Edited on: 26 May 2009 5:38 pm