Cornell Center for Materials Research
Microscopy Image Contest Winners

Microscopy Image Contest Winter 2007

The Microscopy Facilities at the Cornell Center for Materials Research hosted our fourth competition for the best image produced using an electron microscope.

First Place Winners

TEM

SEM (Leica)

Field Emission SEM

AFM/Optical

James Loudon

Ellen Keene

Wenlong Cheng

Matthew Lloyd

Honorable Mention Categories

Interdisciplinary

Technical Difficulty

Most Artistic

Best Caption

Most Unusual

Maxim Kostylev
FE-SEM

Thiti Taychatanapat
FE-SEM

Hong Dong
FE-SEM

Chris Hensley
FE-SEM

Christina Diaz
SEM

Movies

 

All Other Entries

Evan Schwartz
TEM

Stephanie Lee
FE-SEM

Matthew Lloyd
TEM

Karmann Mills
SEM

Peter Ercius
TEM

Matthew Lloyd
SEM

Ian Hosein
AFM

Jeremy Steinbacher
FE-SEM

Scott Warren
TEM

Leon Bellan
FE-SEM

Ferdinand Kuemmeth
FE-SEM

Katy Bosworth
AFM

Lena Fitting Kourkoutis
TEM

Arend van der Zande
FE-SEM

 
Edited on: 06 January 2009 11:44 am