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User Instruments
- Electron and Optical Microscopy
- FEI Titan Themis CryoS/TEM 60-300kV
- B-Nano AirSEM
- Vitrification
- Zeiss Gemini 500 Scanning Electron Microscope
- NION UltraSTEM 100
- Olympus BX51 with crossed polarization
- Olympus BX51 W1F
- Olympus BH-2 with darkfield
- Fischione 1010 Ion mill
- Sputter Coaters
- Leica Ultracut UCT Ultra-microtome
- Leica EM UC7/FC7 Cryo-Ultra-microtome
- Allied Multiprep polishers (A&B)
- JEOL 8900 Microprobe
- LEO 1550 FESEM (Keck SEM)
- Tescan Mira3 FESEM
- FEI Strata 400 STEM FIB
- FEI Tecnai 12 BioTwin TEM
- FEI T12 Spirit TEM STEM
- FEI F20 TEM STEM
- General Test and Measurement Equipment
- Surface Area and Porosimetry Systems
- Varian 979 Port Leak Detector
- SRS-RGA200amu-Portable-RGA-Pump-Station-2-Clark
- Rough Pumps (1-5) Clark Hall
- Portable-Turbo-Pump-3-Clark
- Portable-Turbo-Pump-2-Clark
- Portable-Turbo-Pump-1-Clark
- Portable-Turbo-Pump-1-Bard
- Optical Pyrometer
- Ohaus Balance
- Mettler-Toledo-B303-5-Balance
- Extorr-XT200amu-Portable-RGA-Pump-Station-1-Clark
- Mechanical Properties Testing and Analysis
- Sample Preparation, Cutting, Polishing, Shaping, Joining, and Machining
- West Bond 747630E Wire Bonder
- Vitrification
- Wale Diamond Band Saw
- WELL Diamond wire Saw
- TPT-HB05-Wire-Bonder
- Struers Rotopol
- Portable Spot Welder (Hughes HRW250B)
- Spex 8000 MIXER /MILL
- Fritsch Planetary Micro Mill
- SS White Sand Blasting Unit
- MicroMech Wafering Machine
- Kulicke and Soffa 4500 manual bonder
- Glass Bead Abrasive unit (sand blasting)
- Garlock GEM-T Jet mill
- Cold Mounting Epoxies
- Buehler Simplemet II mounting press
- Buehler Isomet Low Speed Diamond Saw
- Branson Ultrasonic Bath (small)
- Branson Ultrasonic Bath (large)
- Ball Mill
- Aremco Wafer cutting Diamond Saw
- Soft Matter/Polymer Analysis
- Waters MALDI Micro MX (MALDI-TOF)
- TA Instruments DHR3 Rheometer
- JAI-LC9110NEXT-Recycling-Preparative-GPC
- TA Instruments Q1000 Modulated Differential Scanning Calorimeter (MDSC)
- TA Instruments Q500 Thermogravimetric Analyzer (TGA)
- Waters Ambient Temperature GPC: THF
- Waters Ambient Temperature GPC: DMF
- Waters Ambient Temperature GPC: Aqueous
- Spectroscopy and Electronic Measurements
- Cary 5000 UV-Vis-NIR Spectrophotometer
- Edinburgh FLS1000 Spectrometer and Lifetime Measurement
- SQUID Magnetometer
- GMW 5403 C-Frame Magnet Probe System
- GMW5201 Projected Field Magnet Probe System
- Lakeshore Cryogenic Probe Stations
- Cascade CP06 Four Point Probe Setup
- Quantum Design Physical Property Measurement System
- Quantum Design 14T “Blue” PPMS
- Novocontrol Thermal Stimulated Depolarization Current (TSDC)
- Novocontrol Broadband Dielectric Spectrometer
- Shimadzu UV-Vis-NIR Spectrometer
- Bruker Hyperion FT-IR Spectrometer & Microscope
- Bruker Vertex V80V Vacuum FTIR system
- Renishaw InVia Confocal Raman microscope
- Aviv 400 Circular Dichroism Spectrometer
- Surface Analysis and Characterization
- Surface Area and Porosimetry Systems
- Keyence VK-X260 Laser-Scanning Confocal Microscope
- Tencor AlphaStep 500
- ADE Phase Shift MicroXAM Optical interferometric profiler
- Nanonics Multiview 1000 or 2000 Near-field Scanning Optical Microscopy (NSOM)
- X-ray photoelectron spectroscopy XPS
- Asylum-MFP3D-Bio-AFM-SPM
- Test Equipment Lending Library
- Thin Film Deposition and Material Processing
- KSV-NIMA-KN4010-Dip-Coater
- KSV-NIMA-KN2002-Langmuir-Blodgett-Trough
- Inert Gas Glove Box
- Carver 25 ton press
- Enerpac 10 ton press
- Hotpack Vacuum Oven
- National Vacuum Oven
- Lindberg High Vacuum Furnace
- Controlled Atmosphere Furnaces
- Air Furnaces
- Laurell-WS-400A-Spin-Coater
- Varian Thermal Bell Jar Evaporator
- KJL Magnetron Sputtering Tool
- Sputtering Deposition System
- Neocera Ex200 Pulsed Laser Deposition System
- X-ray and Diffraction Analysis
Surface Area and Porosimetry Systems
Owned and operated by the Cornell Energy Institute. Contact Zhengyuan Tu for the techniques below.
Accelerated Surface Area and Porosimetry Systems
Mercury Porosimetry