HomeFacilitiesInstrumentsUser InstrumentsElectron and Optical MicroscopyThermo Fisher Helios G4 UX Focused Ion Beam

Thermo Fisher Helios G4 UX Focused Ion Beam

Room 150 Duffield Hall

The Helios G4 UX Focused Ion Beam (FIB) incorporates the latest electron and ion column technologies to create a very versatile and capable FIB.   The Elstar electron column with the next-generation UC+ technology enables high resolution secondary and backscattered imaging even at low voltages. The Phoenix Ion Column with Fast Beam Blanker is Thermo-Fisher’s most advanced ion column.  It enables high resolution imaging at milling at high voltages, but, even more importantly, continues to perform exceptionally well down to low voltages.  Such low voltages are critical for the production of high-quality lamella with minimal damage layers for transmission electron microscopy (TEM).  Additionally, the beam currents now extend three times higher than previously available, enabling milling of samples not previously possible due to realistic time constraints.

The sample stage is a 150 x 150 mm eucentric piezo stage with an in-chamber Nav-Cam for accurate positioning of samples.  The EasyLift EX NanoManipulator, in combination with the AutoTEM4 automated software, enables automated sample production of TEM lamella, significantly reducing the time required to produce specimens.

Training is provided, and the FIB is available to novice users under the guidance of the facility manager, and to trained users 24/7.  For questions please contact Mick Thomas (mt57@cornell.edu).

Primary Contact

Malcolm (Mick) Thomas
607/255-0650
mt57@cornell.edu
Duffield Hall, Room 150

Secondary Contact

Don Werder
607/255-8959
djw326@cornell.edu
Bard Hall, Room B-57
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