Center News
From JumpStart Project to SiMPore Product
CCMR Staff :: Jun 5, 2009
ITHACA, NY (CCMR Staff) -- SiMPore Introduced New Nanometer Thick TEM Windows for High-Resolution Imaging of Nanoscale Materials. These amorphous silicon TEM winsows were characterized at Cornell University during a CCMR JumpStart project in collaboration with Dr. David Muller, Associate Professor of Applied and Engineering Physics.
More at http://www.temwindows.com/
