This info session will provide background on surface analysis using XPS for elemental analysis, chemical analysis, depth profiling, imaging, and more.
Day 1 will focus on XPS background, applications, and spectra, and will showcase the new XPS capabilities here at Cornell.
Day 2 will focus on analysis of XPS spectra using CasaXPS, a powerful spectral analysis software (Cornell site license). This includes elemental analysis, chemical analysis of bonding states, depth profiling, angle-resolved analysis, and more. Researchers are encouraged to provide their own data for demonstration purposes.