The Bruker D8 Advance ECO powder diffractometer is designed to efficiently measure the x-ray diffraction patterns from powdered samples. This data can be analyzed by the Jade softare package and compared to databases from the International Centre for Diffraction Data (ICDD) to identify a homogeneous sample or obtain the relative abundance of crystalline phases in a mixed sample. Peak locations and widths can be used to calculate strain and mean crystallite size (< 100 nm), or used to determine the structure of a new crystalline material.
The Bruker D8 uses a Cu K-alpha x-ray source, and is not suitable for studying samples with significant Fe content. Typical samples volumes are greater than 80 uL of powdered material, with domain size less than 300 microns. A silicon strip detector collects diffraction over an angular range, enabling efficient data collection.