HomeFacilitiesInstrumentsUser InstrumentsX-ray and Diffraction AnalysisBruker D8 General Area Detector Diffraction System (GADDS)

Bruker D8 General Area Detector Diffraction System (GADDS)

Bard Hall SB56

The Bruker General Area Detector Diffraction System (GADDS) is used to determine phase composition and texture of sub-millimeter spots on samples, with the ability to handle large and oddly shaped samples.

Capabilities

  • Phase identification of polycrystalline materials with spatial resolution down to 0.3 mm
  • Observation of 2D diffraction pattern to characterize systems with partial orientational ordering
  • Sample translation: 40 mm in X, Y, Z
  • Continuous sample rotation while x-ray spot stays fixed on sample
  • Small angle scattering (> 2°) possible with additional configuration
  • Jade analysis software and ICCD database license
  • 1.6 kW Cu-Kα source, can be changed to Co source to avoid Fe fluorescence
  • Easily changeable beam size of 0.3, 0.5, 1.0, 2.0 mm
  • Overhead camera and off-axis laser for alignment

Useful links

Primary Contact

Mark Pfeifer
(607) 255-4161
map322@cornell.edu
Thurston Hall, Room 113

Secondary Contact

Philip Carubia
607/255-6757
pmc228@cornell.edu
Bard Hall, Room B-57
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