The Strata 400 is a DualBeam™ system for high-resolution, high-contrast imaging and specimen preparation. It incorporates a field emission scanning electron microscope column and a focused ion beam column. Complete in-situ sample preparation capabilities and high-resolution imaging enables TEM samples to be prepared without breaking vacuum. Organic, inorganic, and novel materials that are not amenable to conventional preparation methods for SEM and TEM can be prepared.
The Strata is equipped with a complete cryo lift-out system, allowing cryo-SEM analysis of specimens, on-grid thinning of samples for cryo-TEM, and full lift-out preparation of cross-sections for cryo-TEM analysis.