HomeFacilitiesInstrumentsUser InstrumentsSurface Analysis and CharacterizationKeyence VK-X260 Laser-Scanning Profilometer

Keyence VK-X260 Laser-Scanning Profilometer

The Keyence VK-X260 is an excellent tool for optically profiling a sample surface with extremely low (as low as 5 nanometer) vertical resolution. Imagine using a simple laboratory microscope to focus on and determine the height of a single point on a sample. The VK-X260 uses lower-wavelength blue light, and software interpolation to determine height of not just a single point, but for the entire area that it sees. Additionally, using a precision stage, the sample can be moved (Maximum sample area?) and multiple images can be stitched together to look at relatively large areas. 

Below is an example image of a coin which consists of 442 images (17×26) using a 10X objective over 2 hours of capture time. With nearly 5nm vertical resolution and 100nm horizontal resolution, the VK-X260 provides us with extremely high-resolution images of large areas. These images can be turned into CAD drawings, or can be compared with similar images to measure differences between parts, wear on parts, large-scale curvatures, and more. Additionally, the VK-X260 instrument is equipped with a vertical height extender, allowing samples up to 5” in height to be profiled.

Keyence VKX LSCM SOP

Reverse side of a US nickel, images scanned and stitched with 5nm vertical resolution and 100nm horizontal resolution. Acquisition time ~2 hours.

Reverse side of a US nickel, images scanned and stitched with 5nm vertical resolution and 100nm horizontal resolution. Acquisition time ~2 hours with high resolution settings.

 

 

 

 

 

 

 

Primary Contact

Muhammad (Mo) Salim
607-255-8549
ms3563@cornell.edu
Clark Hall, Room D-21

Secondary Contact

Jonathan Shu
607/255-9833
jbs24@cornell.edu
Clark Hall, Room 633
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