The Keyence VK-X260 is an excellent tool for optically profiling a sample surface with extremely low (as low as 5 nanometer) vertical resolution. Imagine using a simple laboratory microscope to focus on and determine the height of a single point on a sample. The VK-X260 uses lower-wavelength blue light, and software interpolation to determine height of not just a single point, but for the entire area that it sees. Additionally, using a precision stage, the sample can be moved (Maximum sample area?) and multiple images can be stitched together to look at relatively large areas.
Below is an example image of a coin which consists of 442 images (17×26) using a 10X objective over 2 hours of capture time. With nearly 5nm vertical resolution and 100nm horizontal resolution, the VK-X260 provides us with extremely high-resolution images of large areas. These images can be turned into CAD drawings, or can be compared with similar images to measure differences between parts, wear on parts, large-scale curvatures, and more. Additionally, the VK-X260 instrument is equipped with a vertical height extender, allowing samples up to 5” in height to be profiled.