HomeFacilitiesInstrumentsUser InstrumentsElectron and Optical MicroscopyTescan Mira3 FESEM

Tescan Mira3 FESEM

Bard Hall SB56
Imaging at very high resolution (1 nm at 30 keV and 2 nm at 1 keV) is possible with certain types of specimens. Its superb performance, particularly at low accelerating voltages (i.e., 0.2 to 1 kV using Beam Deceleration Mode), makes it especially suitable for imaging the surface detail of polymeric, biological, and other low-density materials. Imaging detectors include a standard secondary electron detector for large working distances, a motorized low-energy backscatter electron detector and in-lens (In-Beam Mode) secondary and backscatter electron detectors at short working distances. The Mira SEM is equipped with dual Bruker XFlash EDS detectors and Bruker eFlash HR EBSD for elemental analysis and crystallographic grain orientation studies, respectively.

 

User-Instructions-Mira

Au on Carbon block, 200V in Beam Deceleration Mode

Tescan Mira 3

Tescan Manual

Dual_Detector_Setup

For rates information please see the rates page.

Reservation rules:
There is a 2-week reservation window in Coral. Contact the manager to arrange an exception.
During work hours (8 AM to 5 PM, M to F) please limit reservations to 4 hours or less.
Primary Contact

Don Werder
607/255-8959
djw326@cornell.edu
Bard Hall, Room B-57

Secondary Contact

Philip Carubia
607/255-6757
pmc228@cornell.edu
Bard Hall, Room B-57
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