HomeAboutNewsFacilityAsylum MFP3D-not all scanned probe microscopes are created equal (Nov 2012)

Asylum MFP3D-not all scanned probe microscopes are created equal (Nov 2012)


The Clark Materials Facility is pleased to announce the arrival of the Asylum MFP3D scanned probe microscope, installed in Clark D15. The MFP3D max sample size and scan area are similar to the existing Veeco Dimension3100 (also in Clark D15), however additional capabilities are closed loop motion in X,Y and Z, a 14 micron Z piezo range, plus an open hardware and software design which allows a user to obtain raw electrical signals and control any aspect of microscope motion integrating the scanned probe with any type of measurement possible.
The MFP3D sits on an inverted microscope frame, which enables a range of optical measurements, from optical/fluorescence imaging to photo-induced measurements via laser or other light source. NEW in Spring 2013 will be a single photon counter, enabling probing of optically affected nitrogen vacancy centers.
Also available are two environmental cells, a humidity sensing cell and electrochemistry cell. The humidity cell uses a salt solution to provide varying levels of humidity while the electrochemical cell allows for atomic scale imaging of the same scan area over various periods of electrochemical growth. All cells can be sealed with a rubber apron, so it is possible for samples to be mounted in the cell within a glove box, sealed, and transported to the AFM for imaging without exposure to air. A conductive dual gain AFM module is also available. Using a cantilever with conductive coating, surface conductivity can be imaged within ~1pA to 10uA range. NEW in Spring 2013 will be high voltage tip biasing to 220V, for studying piezoelectric and ferroelectric materials, and Band Excitation Softwarefor probing elastic and dissipative properties of polymers and metals via electrical frequency sweeps.
The above instrumentation was obtained with support from CNS, NYSTAR, CCMR, Kavli, EMC2 and individual researchers.

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