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Texture analysis in the Mira SEM (April 2016)

As part of a 2015 capital equipment investment, a Bruker Electron Backscatter Diffracton (EBSD) system has been installed on the Mira SEM in Bard Hall. EBSD is primarily a technique for obtaining grain orientation information from highly polished samples. It can also reveal the microstructure and, using advance software, can give strain information. The image on the left is a full EBSD scan over ~60 minutes of Austenite steel. An inverse pole figure color map is created which giveAustenite-IPFY-MapImages the crystallographic orientation of the grains with respect to the sample directions. The approximate minimum grain size that can be analyzed is 30 – 40 nanometers.

The EBSD detector also has three RGB electron forescatter detectors (FSD). The FSD allow for rapid, < 1 minute, survey of a sample prior to doing a long scan. For example, the image below is a forescatter image of the above Austenite steel map region. Austenite-FS-Image-2


The determination of individual grain orientation is done by analyzing the Kikuchi pattern generated by electron diffraction from the sample. The image at left is a Kikuchi pattern from an individual grain in the Austenite steel. For the optimal pattern quality samples should be polished to ~0.05 micron surface finish.


Contact Don Werder or Maura Weathers for more information.

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