Bruker D8 Advance ECO Powder Diffractometer
Bruker D8 Advance ECO Powder Diffractometer Details
Bard SB56 (Primary Staff: Mark Pfeifer; Secondary Staff: Kevin Silverstein)
The Bruker D8 Advance ECO powder diffractometer is designed to efficiently measure the X-ray diffraction patterns from powdered and solid samples. This data can be analyzed by the Jade software package and compared to databases from the International Centre for Diffraction Data (ICDD) to identify a homogeneous sample or obtain the relative abundance of crystalline phases in a mixed sample. Peak locations and widths can be used to calculate strain and mean crystallite size (< 100 nm), or used to determine the structure of a new crystalline material.
The Bruker D8 uses a Cu K-alpha X-ray source, and is not suitable for studying samples with significant Fe content. Typical sample volumes are greater than 80 µL of powdered material, with domain size less than 300 microns. A silicon strip detector collects diffraction over an angular range, enabling efficient data collection.
Specifications
- 1 kW Cu-Kα source
- 160 channel silicon strip detector
- Simultaneous θ–2θ scanning
- Jade analysis software and ICCD database license
- Powder sample volumes ≥ 80 µL (≥ 4 µL with reduced volume well)
Uses
- Powder X-ray diffraction pattern with phase analysis.
- Phase identification
- Crystallite size measurement (< 100 nm)
- Lattice determination
- % crystallinity
Useful links:
