Thermo Fisher Scientific Nexsa G2 XPS

Thermo Fisher Scientific Nexsa G2 XPS Details

Clark Hall D10 (Primary Staff: Alicia Tripp; Secondary Staff: Jon Shu)

X-ray photoelectron spectroscopy (XPS) is a powerful surface analysis technique with a sensitivity down to 0.1 atomic percent for most elements, excluding H and He. Quantitative elemental analysis, oxidation state information, and chemical bonding environment can be obtained from XPS spectra. A variety of samples can be analyzed including powders, films, polymers, semiconductors, ceramics, and even air-sensitive materials. Our Nexsa also has ultraviolet photoelectron spectroscopy (UPS) capabilities, allowing for work function measurements and valence band information to be collected.

Specifications

Monochromatic Al-Kα X-ray source
X-ray spot sizes ranging from 10µm - 400µm
Hemispherical analyzer with 128-channel detector
Monatomic and cluster Ar⁺ ion etching and depth profiling
In situ sample tilting for near-surface depth analysis (angle-resolved XPS or ARXPS)
Air-free sample transfer vessel for loading directly from a glovebox
Elemental or chemical imaging via SnapMaps
He^I and He^II sources for UPS

Sample Submission for XPS Analysis by CCMR Staff

Samples can be submitted in Clark D21. Include a sample submission form (linked below) with your sample.
Provide as much detail as possible about the information you want from the measurement. If you want a more complex measurement (depth profiling, area mapping, UPS, etc.), contact the instrument manager before submitting samples.

XPS Sample Submission and FAQ Sheet