CCMR has several surface analysis instruments for analyzing, characterizing, and imaging material surfaces.
 

The Thermo Fisher Scientific Nexsa G2 X-ray Photoelectron Spectrometer (XPS) is a fully automated surface analysis instrument with many capabilities such as near-surface elemental identification and quantification, chemical bonding and oxidation state determination, ion beam depth profiling, chemical mapping of sample surfaces, and work function measurements. 

The Asylum MFP-3D Bio Atomic Force Microscope (AFM) is a scanned probe instrument which can image a sample surface with atom-scale resolution. Specialized probes allow many types of sample-probe interactions to be studied via force curves. A variety of electronic and magnetic microscopy methodologies are available as well. 

Our Keyence VK-X3000 3D Optical Surface Profilometer uses confocal laser optics or white light interferometry to quickly provide 3D surface profiles, accurate surface measurements, roughness parameters, and more. Large analysis areas can be achieved by image stitching.