Bard Hall is now home to a new scanning electron microscope with capabilities complimentary to the existing Keck SEM in Clark Hall. Imaging at very high resolution (1 nm at 30 KeV and 2 nm at 1 KeV) is now possible with certain types of specimens. Its superb performance, particularly at low accelerating voltages (i.e. 0.2 to 1 KV using Beam Deceleration Mode), makes it especially suitable for imaging the surface detail of polymeric, biological, and other low-density materials. In-lens (In-Beam Mode) secondary and back-scattered electron detectors enable a very short working distances. Standard chamber secondary and back-scattered electron detectors are also available for larger working distances, and thus, larger fields of view.
See the equipment page for contact information.