HomeFacilitiesInstrumentsUser InstrumentsElectron and Optical MicroscopyFEI Strata 400 STEM FIB

FEI Strata 400 STEM FIB

20081022151808_IMG_0002.jpg-thumb_0Room B95, Physical Sciences Building

The Strata 400 is a DualBeam™ system for high-resolution, high-contrast imaging and specimen preparation. It incorporates a field emission scanning electron microscope column and a focused ion beam column. Complete in-situ sample preparation capabilities and high-resolution imaging enables TEM samples to be prepared without breaking vacuum. Organic, inorganic, and novel materials that are not amenable to conventional preparation methods for SEM and TEM can be prepared.

Preparation of sample for TEM analysis by FIB lift-out

Preparation of sample for TEM analysis by FIB lift-out process

The Strata is equipped with a complete cryo lift-out system, allowing cryo-SEM analysis of specimens, on-grid thinning of samples for cryo-TEM, and full lift-out preparation of cross-sections for cryo-TEM analysis.

Primary Contact

Katie Spoth
607-255-7598
kas466@cornell.edu
PSB Room, G-07

Secondary Contact

Malcolm (Mick) Thomas
607/255-0650
mt57@cornell.edu
Duffield Hall, Room 150
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