HomeFacilitiesInstrumentsUser InstrumentsElectron and Optical MicroscopyFEI Strata 400 STEM FIB

FEI Strata 400 STEM FIB

20081022151808_IMG_0002.jpg-thumb_0Duffield Hall 150

The Strata 400 is a DualBeam ™ system for high-resolution, high-contrast imaging and specimen preparation. It incorporates a field emission scanning electron microscope column and a focused ion beam column. Complete in-situ sample preparation capabilities and high-resolution imaging enables TEM samples to be prepared without breaking vacuum. Organic, inorganic, and novel materials that are not amenable to conventional preparation methods for SEM and TEM can be prepared.



For rates information, please see the rates page.



Primary Contact

Malcolm (Mick) Thomas
Duffield Hall, Room 150
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