The Zeiss Gemini 500 Scanning Electron Microscope (SEM) takes the best capabilities of the Keck SEM and enhances them. It is primarily designed to provide high resolution imaging at low and ultra-low accelerating voltages (3keV down to 200eV). In this voltage regime contrast from the sample surfaces is optimized. In addition to low voltage Secondary Electron (SE) imaging, it also offers low voltage backscattered (BSE) imaging through the use of an in-column backscatter detector coupled with an energy-selecting filter. As a result, highly-localized BSE’s can be selected resulting in very high resolution BSE imaging of sample surfaces.
Other new capabilities include low-vacuum modes for the imaging of insulating samples, and a multi-segmented detector for bright field and annular dark field Scanning Transmission Electron Microscope (STEM) imaging of very thin samples. A load-lock enables samples to be quickly loaded and unloaded. For further questions please contact Mick Thomas (firstname.lastname@example.org or 607-255-0650).